Modeling electric field sensitive scanning probe measurements for a tip of arbitrary shape

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dc.creatorKuljanishvili, I.
dc.creatorChakraborty, Subhasish
dc.creatorMaasilta, I . J.
dc.creatorTessmer, S. H.
dc.creatorMelloch, M. R.
dc.date2003-09-29
dc.date2004-11-22
dc.date.accessioned2026-07-07T02:53:50Z
dc.date.available2026-07-07T02:53:50Z
dc.descriptionWe present a numerical method to model electric field sensitive scanning probe microscopy measurements which allows for a tip of arbtrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is applied to calculate the spatial resolution of a subsurface charge accumulation imaging system, achieving reasonable agreement with experiment.
dc.description5 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0309667
dc.identifierhttp://arxiv.org/abs/cond-mat/0309667
dc.identifierUltramicroscopy, Volume 102, Issue 1, December 2004, Pages 7-12
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/22318
dc.subjectMesoscale and Nanoscale Physics
dc.subjectMaterials Science
dc.titleModeling electric field sensitive scanning probe measurements for a tip of arbitrary shape
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