Raman Spectroscopy of Graphene Edges

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dc.creatorCasiraghi, C.
dc.creatorHartschuh, A.
dc.creatorQian, H.
dc.creatorPiscanec, S.
dc.creatorGeorgi, C.
dc.creatorNovoselov, K. S.
dc.creatorBasko, D. M.
dc.creatorFerrari, A. C.
dc.date2008-10-29
dc.date.accessioned2026-07-07T13:01:51Z
dc.date.available2026-07-07T13:01:51Z
dc.descriptionGraphene edges are of particular interest, since their chirality determines the electronic properties. Here we present a detailed Raman investigation of graphene flakes with well defined edges oriented at different crystallographic directions. The position, width and intensity of G and D peaks at the edges are studied as a function of the incident light polarization. The D-band is strongest for light polarized parallel to the edge and minimum for perpendicular orientation. Raman mapping shows that the D peak is localized in proximity of the edge. The D to G ratio does not always show a significant dependence on edge orientation. Thus, even though edges can appear macroscopically smooth and oriented at well defined angles, they are not necessarily microscopically ordered.
dc.identifierhttps://arxiv.org/abs/0810.5358
dc.identifierhttp://arxiv.org/abs/0810.5358
dc.identifierNano Lett., 9, 1433 (2009)
dc.identifierdoi:10.1021/nl8032697
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/226288
dc.subjectMaterials Science
dc.titleRaman Spectroscopy of Graphene Edges
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