A k-space transport analysis of the BEEM spectroscopy of Au/Si Schottky barriers

dc.creatorHohenester, U.
dc.creatorKocevar, P.
dc.creatorde Andres, P. L.
dc.creatorFlores, F.
dc.date1997-10-15
dc.date.accessioned2026-07-07T03:09:15Z
dc.date.available2026-07-07T03:09:15Z
dc.descriptionWe address the question of the spatial resolution of ballistic electron emission microscopy (BEEM) of Shottky barriers in Au(111)/Si(100) and Au(111)/Si(111) interfaces. A novel combination of Green-function and k-space Ensemble-Monte-Carlo techniques is used to obtain new insights into the spatial and energetic evolution of the STM-tip-induced electrons during their passage through the metallic layer before reaching the metal-semiconductor interface. In particular, it is shown how the effect of band-structure-induced directional focusing of the electrons enforces a reinterpretation of existing experimental data.
dc.description7 pages, Latex-APS, 2 postscript figures, http://www.icmm.csic.es/Pandres/pedro.htm, Proc. 10th Conf. on Microscopy of Sem. Mat. (Oxford, April 1997), E. T. Cullis, in print
dc.identifierhttps://arxiv.org/abs/cond-mat/9710147
dc.identifierhttp://arxiv.org/abs/cond-mat/9710147
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/27814
dc.subjectMaterials Science
dc.titleA k-space transport analysis of the BEEM spectroscopy of Au/Si Schottky barriers
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