Beam Test of a Segmented Foil SEM Grid

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dc.creatorKopp, S.
dc.creatorIndurthy, D.
dc.creatorPavlovich, Z.
dc.creatorProga, M.
dc.creatorZwaska, R.
dc.creatorChildress, S.
dc.creatorFord, R.
dc.creatorKendziora, C.
dc.creatorKobilarcik, T.
dc.creatorMoore, C.
dc.creatorTassotto, G.
dc.date2005-07-29
dc.date.accessioned2026-07-07T13:06:26Z
dc.date.available2026-07-07T13:06:26Z
dc.descriptionA prototype Secondary-electron Emission Monitor (SEM) was installed in the 8 GeV proton transport line for the MiniBooNE experiment at Fermilab. The SEM is a segmented grid made with 5 um Ti foils, intended for use in the 120 GeV NuMI beam at Fermilab. Similar to previous workers, we found that the full collection of the secondary electron signal requires a bias voltage to draw the ejected electrons cleanly off the foils, and this effect is more pronounced at larger beam intensity. The beam centroid and width resolutions of the SEM were measured at beam widths of 3, 7, and 8 mm, and compared to calculations. Extrapolating the data from this beam test, we expect a centroid and width resolutions of 20um and 25 um, respectively, in the NuMI beam which has 1 mm spot size.
dc.descriptionsubmitted to Nucl. Instr. Meth. A
dc.identifierhttps://arxiv.org/abs/physics/0507211
dc.identifierhttp://arxiv.org/abs/physics/0507211
dc.identifierNucl.Instrum.Meth.A554:138-146,2005
dc.identifierdoi:10.1016/j.nima.2005.08.076
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/227783
dc.subjectInstrumentation and Detectors
dc.subjectHigh Energy Physics - Experiment
dc.subjectAccelerator Physics
dc.titleBeam Test of a Segmented Foil SEM Grid
dc.typetext

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