Comment on ``Four-Point Resistance of Individual Single-Wall Carbon Nanotubes'' by Gao et al. PRL 95, 196208 (2005)

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dc.creatorDas, Mukunda P.
dc.creatorGreen, Frederick
dc.creatorThakur, Jagdish S.
dc.date2006-01-25
dc.date2006-06-21
dc.date.accessioned2026-07-07T06:57:48Z
dc.date.available2026-07-07T06:57:48Z
dc.descriptionWe remark on some delicate points that attend the physical meaning of intrinsic device resistance.
dc.descriptionfixed typos
dc.identifierhttps://arxiv.org/abs/cond-mat/0601595
dc.identifierhttp://arxiv.org/abs/cond-mat/0601595
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/107104
dc.subjectMesoscale and Nanoscale Physics
dc.titleComment on ``Four-Point Resistance of Individual Single-Wall Carbon Nanotubes'' by Gao et al. PRL 95, 196208 (2005)
dc.typetext

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