Resonant inelastic x-ray scattering as a probe of optical scale excitations in strongly electron-correlated systems: quasi-localized view

Simple item page
dc.creatorButorin, Sergei M.
dc.date1999-09-30
dc.date.accessioned2026-07-07T03:14:42Z
dc.date.available2026-07-07T03:14:42Z
dc.descriptionAn application of resonant inelastic x-ray scattering technique for studying of optical scale excitations in electron-correlated materials is discussed. Examples are given including data obtained for 3d transition metal, lanthanide, and actinide systems. In some cases, the data are compared with the results of crystal-field multiplet and Anderson impurity model calculations. Advantages of this technigue are pointed out, such as an ability to probe an extended multiplet structure of the ground state configuration, which is not fully accessible by other spectroscopies, an extreme sensitivity of spectral profiles to the chemical state of the element in question and to the crystal-field strength, and a great potential in probing the ground state character (for example, ground state J-mixing in rare-earths) due to the technique's elemental selectivity and strict selection rules. Issues are addressed, such as a possible deviations from the linear dispersion of inelastic scattering structures, corresponding to charge-transfer excitations, with varying excitation energies and an estimation of values for model parameters, involved in the description of charge-transfer processes
dc.description23 pages, 21 figures, uses fleqn.sty, espcrc2.sty, float.sty, will appear in J. Electron Spectrosc. & Rel. Phenom
dc.identifierhttps://arxiv.org/abs/cond-mat/9909446
dc.identifierhttp://arxiv.org/abs/cond-mat/9909446
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/29771
dc.subjectStrongly Correlated Electrons
dc.titleResonant inelastic x-ray scattering as a probe of optical scale excitations in strongly electron-correlated systems: quasi-localized view
dc.typetext

Files

Collections

arXiv