Experimental measurements of multiple stable trapped domain wall states induced in nanofabricated elements

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dc.creatorLacour, D.
dc.creatorKatine, J. A.
dc.creatorFolks, L.
dc.creatorBlock, T.
dc.creatorChildress, J. R.
dc.creatorCarey, M. J.
dc.creatorGurney, B. A.
dc.date2003-06-18
dc.date.accessioned2026-07-07T02:51:55Z
dc.date.available2026-07-07T02:51:55Z
dc.descriptionThe presence of a domain wall trapped by a sub-micron notch is probed in two ways: through electronic transport measurements and by Magnetic Force Microscopy (MFM). We observe complex magnetic features which are consistent with numerical simulations predicting the existence of multiple magnetic configurations stabilized by the notch structure.
dc.description11 pages, 4 figures, submited to Appl. Phys. Lett
dc.identifierhttps://arxiv.org/abs/cond-mat/0306486
dc.identifierhttp://arxiv.org/abs/cond-mat/0306486
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/21651
dc.subjectMaterials Science
dc.titleExperimental measurements of multiple stable trapped domain wall states induced in nanofabricated elements
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