Nanoindentation-Induced Phase Transformation in Silicon

dc.creatorRao, R.
dc.creatorBradby, J. -E.
dc.creatorWilliams, J. -S.
dc.date2007-08-09
dc.date.accessioned2026-07-07T08:22:56Z
dc.date.available2026-07-07T08:22:56Z
dc.descriptionNanoindentation-induced phase transformation in silicon has been studied. A series of nanoindentations were made with the sharp diamond Berkovich tip. During nanoindentations, maximum load ranged from 2000 $μ$N to 5000 $μ$N, with a 1000 $μ$N/sec loading rate. Slow unloading rate at 100$μ$N/sec was chosen to favor the formation of the crystalline end phases, high pressure phase (Si-III and Si-XII). Fast unloading rate at 1000$μ$N/sec was used to obtain amorphous phase. The phase transformation was examined by Raman spectroscopy and plan-view transmission electron microscopy (TEM). HPP have been identified even if no "pop-in" and "pop-out" observed in load-depth characteristics curves. HPP appeared in c-Si when the maximum load up to 3000 $μ$N. TEM images have been revealed that the optimization HPP transformation in c-Si at the nanoscale occurred when the maximum load applied at 5000 $μ$N.
dc.identifierhttps://arxiv.org/abs/0708.1294
dc.identifierhttp://arxiv.org/abs/0708.1294
dc.identifierDans European Nano Systems Worshop - ENS 2006, Paris : France (2006)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/135822
dc.subjectMaterials Science
dc.titleNanoindentation-Induced Phase Transformation in Silicon
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