Opening a New Window to Fundamental Physics and Astrophysics: X-ray Polarimetry

Costa, E.; Bellazzini, R.; Soffitta, P.; di Persio, G.; Feroci, M.; Morelli, E.; Muleri, F.; Pacciani, L.; Rubini, A.; Baldini, L.; Bitti, F.; Brez, A.; Cavalca, F.; Latronico, L.; Massai, M. M.; Omodei, N.; Sgro', C.; Spandre, G.; Matt, G.; Perola, G. C.; Santangelo, A.; Celotti, A.; Barret, D.; Vilhu, O.; Piro, L.; Fraser, G.; Courvoisier, T. J. -L.; Barcons, X.

Opening a New Window to Fundamental Physics and Astrophysics: X-ray Polarimetry

Authors

Description

An extensive theoretical literature predicts that X-ray Polarimetry can directly determine relevant physical and geometrical parameters of astrophysical sources, and discriminate between models further than allowed by spectral and timing data only. X-ray Polarimetry can also provide tests of Fundamental Physics. A high sensitivity polarimeter in the focal plane of a New Generation X-ray telescope could open this new window in the High Energy Sky.
8 pages 1 table 14 figures