The instrument response function in air-based scanning tunneling microscopy

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dc.creatorFraundorf, P.
dc.creatorTentschert, J.
dc.date1997-12-01
dc.date.accessioned2026-07-07T05:55:58Z
dc.date.available2026-07-07T05:55:58Z
dc.descriptionThe distinction between point and line resolution in transmission electron microscopy (TEM) arises because an ability to image sub-0.2 nm fringes is a necessary, but not a sufficient, condition for imaging individual atoms. In scanned tip microscopy, as in TEM, empirical data on instrument response should precede assertions about point resolution. In the ``slow scan limit'', time-domain noise and geometry effects decouple, and tip shape can take on the role of a 2-dimensional impulse response function. We indicate here that nuclear track pits can be used to quantitatively measure tip geometry with nanometer-scale resolution in three dimensions, that stationary tip images provide a robust measure of time-domain instabilities, and that when these data are taken before and after imaging an unknown, images with instrument response quantitatively constrained by experiment are possible. Specimen-induced tip effects also become measurable in situ.
dc.description4 pages (1 fig, 16 refs) RevTeX; apps http://newton.umsl.edu/stei_lab/
dc.identifierhttps://arxiv.org/abs/physics/9712003
dc.identifierhttp://arxiv.org/abs/physics/9712003
dc.identifierUltramicroscopy 37 (1991) 125-129
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/87439
dc.subjectInstrumentation and Detectors
dc.subjectMaterials Science
dc.subjectOptics
dc.titleThe instrument response function in air-based scanning tunneling microscopy
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