Charge fluctuations and dephasing in coulomb coupled conductors

dc.creatorButtiker, Markus
dc.date1999-11-12
dc.date.accessioned2026-07-07T03:15:06Z
dc.date.available2026-07-07T03:15:06Z
dc.descriptionIt is shown that the dephasing rate in Coulomb coupled mesoscopic structures is determined by charge relaxation resistances. The charge relaxation resistance together with the capacitance determines the RC-time of the mesoscopic structure and at small frequencies determines the voltage fluctuation spectrum. Self-consistent expressions are presented which give the charge relaxation resistance and consequently the dephasing rate in terms of the diagonal and off-diagonal elements of a generalized Wigner-Smith delay-time matrix. Dephasing rates are discussed both for the equilibrium state and in the transport state in which charge fluctuations are generated by shot noise. A number of different geometries are discussed. This article is to appear in {\it Quantum Mesoscopic Phenomena and Mesoscopic Devices}, edited by I. O. Kulik and R. Ellialtioglu, (Kluwer, unpublished).
dc.identifierhttps://arxiv.org/abs/cond-mat/9911188
dc.identifierhttp://arxiv.org/abs/cond-mat/9911188
dc.identifierin "Quantum Mesoscopic Phenomena and Mesoscopic Devices", edited by I. O. Kulik and R. Ellialtioglu, (Kluwer, Academic Publishers, Dordrecht, 2000). Vol. 559, p. 211
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/29917
dc.subjectMesoscale and Nanoscale Physics
dc.titleCharge fluctuations and dephasing in coulomb coupled conductors
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