Low-temperature scanning probe microscopy using a tuning fork transducer

dc.creatorSeo, Yongho
dc.creatorCadden-Zimansky, Paul
dc.creatorChandrasekhar, Venkat
dc.date2006-04-18
dc.date.accessioned2026-07-07T07:05:34Z
dc.date.available2026-07-07T07:05:34Z
dc.descriptionWe have developed a low-temperature scanning probe microscope using a quartz tuning fork operating at 4.2 K. A silicon tip from a commercial cantilever was attached to one prong of the tuning fork. With a metallic coating, a potential could be applied to the tip to sense the charge distribution in a sample, while with a magnetically coated tip, magnetic force imaging could be performed. For the coarse approach mechanism, we developed a reliable low-temperature walker with low material cost and simple machining. We have obtained Coulomb force images of boron nanowires at room temperature and magnetic nano-structures at low temperature. For lift-mode scanning, we employed a frequency detection mode for the first topographic scan and phase detection mode for the second lift scan.
dc.description6 pages, 8 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0604407
dc.identifierhttp://arxiv.org/abs/cond-mat/0604407
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/109713
dc.subjectMesoscale and Nanoscale Physics
dc.titleLow-temperature scanning probe microscopy using a tuning fork transducer
dc.typetext

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