Tailor-made tests for goodness of fit to semiparametric hypotheses

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dc.creatorBickel, Peter J.
dc.creatorRitov, Ya'acov
dc.creatorStoker, Thomas M.
dc.date2006-07-01
dc.date.accessioned2026-07-07T08:07:58Z
dc.date.available2026-07-07T08:07:58Z
dc.descriptionWe introduce a new framework for constructing tests of general semiparametric hypotheses which have nontrivial power on the $n^{-1/2}$ scale in every direction, and can be tailored to put substantial power on alternatives of importance. The approach is based on combining test statistics based on stochastic processes of score statistics with bootstrap critical values.
dc.descriptionPublished at http://dx.doi.org/10.1214/009053606000000137 in the Annals of Statistics (http://www.imstat.org/aos/) by the Institute of Mathematical Statistics (http://www.imstat.org)
dc.identifierhttps://arxiv.org/abs/math/0607014
dc.identifierhttp://arxiv.org/abs/math/0607014
dc.identifierAnnals of Statistics 2006, Vol. 34, No. 2, 721-741
dc.identifierdoi:10.1214/009053606000000137
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/131109
dc.subjectStatistics Theory
dc.subject62G10, 62G20 (Primary) 62G09 (Secondary)
dc.titleTailor-made tests for goodness of fit to semiparametric hypotheses
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