New multi-sample nonparametric tests for panel count data

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dc.creatorBalakrishnan, N.
dc.creatorZhao, Xingqiu
dc.date2009-04-20
dc.date.accessioned2026-07-07T13:05:54Z
dc.date.available2026-07-07T13:05:54Z
dc.descriptionThis paper considers the problem of multi-sample nonparametric comparison of counting processes with panel count data, which arise naturally when recurrent events are considered. Such data frequently occur in medical follow-up studies and reliability experiments, for example. For the problem considered, we construct two new classes of nonparametric test statistics based on the accumulated weighted differences between the rates of increase of the estimated mean functions of the counting processes over observation times, wherein the nonparametric maximum likelihood approach is used to estimate the mean function instead of the nonparametric maximum pseudo-likelihood. The asymptotic distributions of the proposed statistics are derived and their finite-sample properties are examined through Monte Carlo simulations. The simulation results show that the proposed methods work quite well and are more powerful than the existing test procedures. Two real data sets are analyzed and presented as illustrative examples.
dc.descriptionPublished in at http://dx.doi.org/10.1214/08-AOS599 the Annals of Statistics (http://www.imstat.org/aos/) by the Institute of Mathematical Statistics (http://www.imstat.org)
dc.identifierhttps://arxiv.org/abs/0904.2952
dc.identifierhttp://arxiv.org/abs/0904.2952
dc.identifierAnnals of Statistics 2009, Vol. 37, No. 3, 1112-1149
dc.identifierdoi:10.1214/08-AOS599
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/227641
dc.subjectStatistics Theory
dc.subject62G10 (Primary) 62G20 (Secondary)
dc.titleNew multi-sample nonparametric tests for panel count data
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