Bulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy

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dc.creatorBassi, A. Li
dc.creatorCasari, C. S.
dc.creatorCattaneo, D.
dc.creatorDonati, F.
dc.creatorFoglio, S.
dc.creatorPassoni, M.
dc.creatorBottani, C. E.
dc.creatorBiagioni, P.
dc.creatorBrambilla, A.
dc.creatorFinazzi, M.
dc.creatorCiccacci, F.
dc.creatorDuo', L.
dc.date2007-09-17
dc.date2007-10-29
dc.date.accessioned2026-07-07T08:38:44Z
dc.date.available2026-07-07T08:38:44Z
dc.descriptionA simple, reliable method for preparation of bulk Cr tips for Scanning Tunneling Microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and Spin Polarized-STM (SP-STM) are investigated. Cr tips show atomic resolution on ordered surfaces. Contrary to what happens with conventional W tips, rest atoms of the Si(111)-7x7 reconstruction can be routinely observed, probably due to a different electronic structure of the tip apex. SP-STM measurements of the Cr(001) surface showing magnetic contrast are reported. Our results reveal that the peculiar properties of these tips can be suited in a number of STM experimental situations.
dc.identifierhttps://arxiv.org/abs/0709.2615
dc.identifierhttp://arxiv.org/abs/0709.2615
dc.identifierApplied Physics Letters 91, 173120 (2007)
dc.identifierdoi:10.1063/1.2800810
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/140838
dc.subjectMaterials Science
dc.titleBulk Cr tips for scanning tunneling microscopy and spin-polarized scanning tunneling microscopy
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