Exact analytical solution for electrostatic field produced by biased atomic force microscope tip dwelling above dielectric-conductor bi-layer

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dc.creatorLyuksyutov, Sergei F.
dc.creatorSharipov, Ruslan A.
dc.creatorSigalov, Grigori
dc.creatorParamonov, Pavel B
dc.date2004-08-11
dc.date2004-08-12
dc.date.accessioned2026-07-07T02:59:41Z
dc.date.available2026-07-07T02:59:41Z
dc.descriptionAn exact analytical solution based on the method of images has been obtained for the description of the electrostatic field in the system comrising of atomic force microscope (AFM)tip, dielectric, and conductor. The solution provides a step towards quantitative modelling of AFM-assisted electrostatic nanolithography in polymers.
dc.description6 pages 1 figure
dc.identifierhttps://arxiv.org/abs/cond-mat/0408247
dc.identifierhttp://arxiv.org/abs/cond-mat/0408247
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/24608
dc.subjectMaterials Science
dc.subjectSoft Condensed Matter
dc.titleExact analytical solution for electrostatic field produced by biased atomic force microscope tip dwelling above dielectric-conductor bi-layer
dc.typetext

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