Space-Charge-Limited Current Fluctuations in Organic Semiconductors

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dc.creatorCarbone, A.
dc.creatorKotowska, B. K.
dc.creatorKotowski, D.
dc.date2005-05-21
dc.date2006-01-12
dc.date.accessioned2026-07-07T06:37:49Z
dc.date.available2026-07-07T06:37:49Z
dc.descriptionLow-frequency current fluctuations are investigated over a bias range covering {\em ohmic}, {\em trap-filling} and {\em space-charge-limited current} regimes in polycrystalline polyacenes. The relative current noise power spectral density ${\cal S}(f)$ is constant in the {\em ohmic} region, steeply increases at the {\em trap-filling transition} region and decreases in the {\em space-charge-limited-current} region. The {\em noise peak} at the {\em trap-filling transition} is accounted for within a {\em continuum percolation model}. As the quasi-Fermi level crosses the trap level, intricate insulating paths nucleate within the ohmic matrix, determining the onset of non-equilibrium conditions at the interface between the insulating and conducting phase. The {\em noise peak} is written in terms of the free and trapped charge carrier densities.
dc.descriptioncorrected proofs
dc.identifierhttps://arxiv.org/abs/cond-mat/0505533
dc.identifierhttp://arxiv.org/abs/cond-mat/0505533
dc.identifierPhys. Rev. Lett. 95, 236601 (2005)
dc.identifierdoi:10.1103/PhysRevLett.95.236601
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/100527
dc.subjectDisordered Systems and Neural Networks
dc.subjectMaterials Science
dc.titleSpace-Charge-Limited Current Fluctuations in Organic Semiconductors
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