Strongly Enhanced Thermal Stability of Crystalline Organic Thin Films Induced by Aluminum Oxide Capping Layers

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dc.creatorSellner, Stefan
dc.creatorGerlach, Alexander
dc.creatorSchreiber, Frank
dc.creatorKelsch, Marion
dc.creatorKasper, Nikolai
dc.creatorDosch, Helmut
dc.creatorMeyer, Stephan
dc.creatorPflaum, Jens
dc.creatorFischer, Matthias
dc.creatorGompf, Bruno
dc.date2004-07-22
dc.date.accessioned2026-07-07T02:59:21Z
dc.date.available2026-07-07T02:59:21Z
dc.descriptionWe show that the thermal stability of thin films of the organic semiconductor diindenoperylene (DIP) can be strongly enhanced by aluminum oxide capping layers. By thermal desorption spectroscopy and in-situ X-ray diffraction we demonstrate that organic films do not only stay on the substrate, but even remain crystalline up to 460C, i.e. 270 deg. above their desorption point for uncapped films (190C). We argue that this strong enhancement of the thermal stability compared to uncapped and also metal-capped organic layers is related to the very weak diffusion of aluminum oxide and the structurally well-defined as-grown interfaces. We discuss possible mechanisms for the eventual breakdown at high temperatures.
dc.description5 pages, 4 figures, submitted to Adv. Mat., for further information see http://www.physchem.ox.ac.uk/~fs
dc.identifierhttps://arxiv.org/abs/cond-mat/0407588
dc.identifierhttp://arxiv.org/abs/cond-mat/0407588
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/24474
dc.subjectMaterials Science
dc.titleStrongly Enhanced Thermal Stability of Crystalline Organic Thin Films Induced by Aluminum Oxide Capping Layers
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