Crystal Growth of Isotactic Polystyrene in Ultrathin Films : Film Thickness Dependence

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dc.creatorTaguchi, Ken
dc.creatorMiyaji, Hideki
dc.creatorIzumi, Kunihide
dc.creatorHoshino, Akitaka
dc.creatorMiyamoto, Yoshihisa
dc.creatorKokawa, Ryohei
dc.date2001-11-08
dc.date2001-11-10
dc.date.accessioned2026-07-07T02:43:25Z
dc.date.available2026-07-07T02:43:25Z
dc.descriptionThe film thickness dependence of crystal growth is investigated for isotactic polystyrene (it-PS) in thin films, the thickness of which is from 20nm down to 4nm. The single crystals of it-PS grown at 180 in the ultrathin films show the morphology typical in the diffusion-controlled growth: dense branching morphology (DBM), fractal seeweed (FS). The characteristic length of the morphology, i.e. the width of the branch, increases with decreasing film thickness. The thickness dependence of the growth rate of crystals shows a crossover around the lamellar thickness of the crystal, 8 nm. The thickness dependences of the growth rate and morphology are discussed in terms of the diffusion of chain molecules in thin films.
dc.descriptionLatex2e files; 7 pages, 6 figures; submitted to J. Macro. Sci. Phys
dc.identifierhttps://arxiv.org/abs/cond-mat/0111137
dc.identifierhttp://arxiv.org/abs/cond-mat/0111137
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/18492
dc.subjectSoft Condensed Matter
dc.titleCrystal Growth of Isotactic Polystyrene in Ultrathin Films : Film Thickness Dependence
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