Thickness dependence of the ground-state properties in thin films of the heavy-fermion compound CeCu_6

Simple item page
dc.creatorGroten, D.
dc.creatorvan Baarle, G. J. C.
dc.creatorAarts, J.
dc.creatorNieuwenhuys, G. J.
dc.creatorMydosh, J. A.
dc.date2001-07-03
dc.date.accessioned2026-07-07T02:42:01Z
dc.date.available2026-07-07T02:42:01Z
dc.descriptionHigh-quality thin polycrystalline films of the heavy-fermion compound CeCu_6 were prepared by sputter deposition. The thicker of these films (with thickness up to around 200 nm) reproduce the properties of the bulk compound CeCu_6. As the thickness of the films is decreased, our measurements display strong deviations from the bulk properties, namely, a suppression of the heavy-fermion state. We show that possible `external' effects, like disorder, oxidation and morphology can be excluded and that this size effect is therefore an intrinsic property of CeCu_6. In addition, we investigate possible scenarios explaining the size effect, and find that the proximity of CeCu_6 to a quantum phase transition can account for this striking result.
dc.description7 pages, 5 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0107049
dc.identifierhttp://arxiv.org/abs/cond-mat/0107049
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/17973
dc.subjectStrongly Correlated Electrons
dc.titleThickness dependence of the ground-state properties in thin films of the heavy-fermion compound CeCu_6
dc.typetext

Files

Collections

arXiv