Ti-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy

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dc.creatorWang, C.
dc.creatorZhang, H. J.
dc.creatorHe, P. M.
dc.creatorCao, G. H.
dc.date2007-08-17
dc.date.accessioned2026-07-07T08:24:04Z
dc.date.available2026-07-07T08:24:04Z
dc.descriptionCleaved and polished surfaces of CaCu$_3$Ti$_4$O$_{12}$ ceramics have been investigated by x-ray photoelectron spectroscopy (XPS) and energy dispersive x-ray spectroscopy (EDX), respectively. While EDX technique shows the identical CaCu$_3$Ti$_4$O$_{12}$ stoichiometry for the two surfaces, XPS indicates that the cleaved surface with grain-boundary layers is remarkably Ti-rich and Cu-poor. The core-level spectrum of Cu 2$p$ unambiguously shows the existence of monovalent copper only for the cleaved surface. Possible grain-boundary structure and its formation are discussed.
dc.description8 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/0708.2301
dc.identifierhttp://arxiv.org/abs/0708.2301
dc.identifierAPPLIED PHYSICS LETTERS 91, 052910 (2007)
dc.identifierdoi:10.1063/1.2768006
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/136216
dc.subjectMaterials Science
dc.subjectOther Condensed Matter
dc.titleTi-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy
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