Linear and nonlinear regime of a Random Resistor Network under biased percolation
| dc.creator | Pennetta, C. | |
| dc.creator | Alfinito, E. | |
| dc.creator | Reggiani, L. | |
| dc.date | 2002-01-10 | |
| dc.date.accessioned | 2026-07-07T02:44:05Z | |
| dc.date.available | 2026-07-07T02:44:05Z | |
| dc.description | We investigate the steady state of a two-dimensional random resistor network subjected to two competing biased percolations as a function of the bias strength. The properties of the linear and nonlinear regimes are studied by means of Monte Carlo simulations. In constant current conditions, a scaling relation is found between $<R>/<R>_0$ and $I/I_0$, where $<R>$ is the average network resistance, $<R>_0$ the Ohmic resistance and $I_0$ an appropriate threshold value for the onset of nonlinearity. A similar scaling relation is found also for the relative variance of resistance fluctuations. These results are in good agreement with electrical breakdown measurements performed in composite materials. | |
| dc.description | Contribution to the Proceedings of the Workshop CMS2001 | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0201152 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0201152 | |
| dc.identifier | Comp. Mat. Sci. 30, 120 (2004) | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/18766 | |
| dc.subject | Statistical Mechanics | |
| dc.title | Linear and nonlinear regime of a Random Resistor Network under biased percolation | |
| dc.type | text |