Dielectric and Dilatometric Studies of Glass Transitions in Thin Polymer Films

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dc.creatorFukao, Koji
dc.creatorMiyamoto, Yoshihisa
dc.date2000-12-26
dc.date.accessioned2026-07-07T02:39:53Z
dc.date.available2026-07-07T02:39:53Z
dc.descriptionDielectric relaxation and thermal expansion spectroscopy were made for thin polystyrene films in order to measure the temperature $T_α$ corresponding to the peak in the loss component of susceptibility due to the $α$-process and the $α$-relaxation time $τ$ as functions of film thickness $d$. While the glass transition temperature $T_{\rm g}$ decreases with decreasing film thickness, $T_α$ and $τ$ were found to remain almost constant for $d>d_{\rm c}$ and decrease drastically for $d<d_{\rm c}$ for high temperatures. Here, $d_{\rm c}$ is a critical thickness. Near the glass transition temperature, the thickness dependence of $T_α$ and $τ$ is more prominent. The relation between the fragility index and non-exponentiallity is discussed for thin films of polystyrene.
dc.description4 pages, 5 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0012464
dc.identifierhttp://arxiv.org/abs/cond-mat/0012464
dc.identifierJ.Phys.IV France Vol.10 (2000) Pr7-243-246
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/17193
dc.subjectSoft Condensed Matter
dc.titleDielectric and Dilatometric Studies of Glass Transitions in Thin Polymer Films
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