Carrier doping to pseudo-low-dimensional compound La2RuO5

dc.creatorUehara, Masatomo
dc.creatorAshikawa, Kenich
dc.creatorAka, Yoshimasa
dc.creatorKimishima, Yoshihide
dc.date2008-10-02
dc.date.accessioned2026-07-07T10:07:02Z
dc.date.available2026-07-07T10:07:02Z
dc.descriptionHole carrier doping has been tried to pseudo-low-dimensional material La2RuO5 by substituting La3+ with Cd2+. Single phased samples of La2-xCdxRuO5 with x up to 0.5 have been successfully obtained and also high pressure O2 annealing has been performed to the x=0.5 sample. Although the formal ionic state of Ru is expected to increase from 4+ (at x=0) to 4.5+ (at x=0.5), the magnetic and electrical properties show no significant changes in as-sintered samples. In contrast, high pressure O2 annealed x=0.5 samples show a little reduction of electrical resistivity and the decrease of thermoelectric power at 260 K. From these results, it can be speculated that the doped carriers are mostly compensated by oxygen deficiency in as-sintered samples.
dc.description10 pages, 7 figures
dc.identifierhttps://arxiv.org/abs/0810.0350
dc.identifierhttp://arxiv.org/abs/0810.0350
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/170496
dc.subjectMaterials Science
dc.subjectStrongly Correlated Electrons
dc.titleCarrier doping to pseudo-low-dimensional compound La2RuO5
dc.typetext

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