Thickness-Dependence of the Coercive Field in Ferroelectrics
| dc.creator | Chandra, P. | |
| dc.creator | Dawber, M. | |
| dc.creator | Littlewood, P. B. | |
| dc.creator | Scott, J. F. | |
| dc.date | 2002-06-03 | |
| dc.date.accessioned | 2026-07-07T02:45:43Z | |
| dc.date.available | 2026-07-07T02:45:43Z | |
| dc.description | For forty years researchers on ferroelectric switching have used the Kay-Dunn theory to model the thickness-dependence of the coercive field; it works surprisingly well, despite the fact that it is based upon homogeneous nucleation and a small-field expansion, neither of which is realized in thin films. Here we demonstrate that this result can be obtained from a more general Kolmogorov-Avrami model of (inhomogeneous) nucleation and growth. By including a correction to the switching field across the dielectric that includes Thomas-Fermi screening in the metal electrode, we show that our theory quantitatively describes the coercive fields versus thickness in several different families of ferroelectric (lead zirconate-titanate [PZT], potassium nitrate, and polyvinylidenefluoride [PVDF]) over a wide range of thickness (5 decades). This agreement is particularly satisfying in the case of PVDF, as it indicates that the switching kinetics are domain-wall limited down to 1 nanometer and thus require no new effects. | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0206014 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0206014 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/19401 | |
| dc.subject | Materials Science | |
| dc.title | Thickness-Dependence of the Coercive Field in Ferroelectrics | |
| dc.type | text |