Soft X-ray Resonant Magnetic Scattering Studies on Fe/CoO Exchange Bias System

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dc.creatorRadu, Florin
dc.creatorNefedov, Alexei
dc.creatorGrabis, Johannes
dc.creatorNowak, Gregor
dc.creatorBergmann, Andre
dc.creatorZabel, Hartmut
dc.date2005-05-19
dc.date.accessioned2026-07-07T06:26:40Z
dc.date.available2026-07-07T06:26:40Z
dc.descriptionWe have used soft X-ray Resonant Magnetic Scattering (XRMS) to search for the presence of an effective ferromagnetic moment belonging to the antiferromagnetic (AF) layer which is in close contact with a ferromagnetic (F) layer. Taking advantage of the element specificity of the XRMS technique, we have measured hysteresis loops of both Fe and CoO layers of a CoO(40 Å)/Fe(150 Å) exchange bias bilayer. From these measurements we have concluded that the proximity of the F layer induces a magnetic moment in the AF layer. The F moment of the AF layer has two components: one is frozen and does not follow the applied magnetic field and the other one follows in phase the ferromagnetic magnetization of the F layer. The temperature dependence of the F components belonging to the AF layer is shown and discussed.
dc.description5 pages, 4 figures, submitted to J. Magn. Magn. Mater
dc.identifierhttps://arxiv.org/abs/cond-mat/0505482
dc.identifierhttp://arxiv.org/abs/cond-mat/0505482
dc.identifierJ. Magn. Magn. Mater. 300 (2006) 206-210
dc.identifierdoi:10.1016/j.jmmm.2005.10.064
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/97175
dc.subjectMaterials Science
dc.titleSoft X-ray Resonant Magnetic Scattering Studies on Fe/CoO Exchange Bias System
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