Self-organized criticality in the Bean state in YBa$_2$Cu$_3$O$_{7-x}$ thin films
| dc.creator | Aegerter, C. M. | |
| dc.creator | Welling, M. S. | |
| dc.creator | Wijngaarden, R. J. | |
| dc.date | 2003-05-26 | |
| dc.date.accessioned | 2026-07-07T02:51:32Z | |
| dc.date.available | 2026-07-07T02:51:32Z | |
| dc.description | The penetration of magnetic flux into a thin film of YBa$_2$Cu$_3$O$_{7-x}$ is studied when the external field is ramped slowly. In this case the flux penetrates in bursts or avalanches. The size of these avalanches is distributed according to a power law with an exponent of $τ$ = 1.29(2). The additional observation of finite-size scaling of the avalanche distributions, with an avalanche dimension D = 1.89(3), gives strong indications towards self-organized criticality in this system. Furthermore we determine exponents governing the roughening dynamics of the flux surface using some universal scaling relations. These exponents are compared to those obtained from a standard roughening analysis. | |
| dc.description | 4 pages, 4 figures, submitted to PRL | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0305591 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0305591 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/21492 | |
| dc.subject | Soft Condensed Matter | |
| dc.subject | Statistical Mechanics | |
| dc.title | Self-organized criticality in the Bean state in YBa$_2$Cu$_3$O$_{7-x}$ thin films | |
| dc.type | text |