Measurement of the $B^{0}_{s}$ Lifetime Using Semileptonic Decays

dc.creatorD0 Collaboration
dc.creatorAbazov, V. M.
dc.date2006-04-24
dc.date2006-12-03
dc.date.accessioned2026-07-07T11:58:13Z
dc.date.available2026-07-07T11:58:13Z
dc.descriptionWe report a measurement of the $B^0_{s}$ lifetime in the semileptonic decay channel $B^0_{s}\to D^-_s μ^{+}νX$ (and its charge conjugate), using approximately 0.4 fb$^{-1}$ of data collected with the D0 detector during 2002 -- 2004. We have reconstructed 5176 $D^-_s μ^{+}$ signal events, where the $D_s^-$ is identified via the decay $D_s^-\to ϕπ^-$, followed by $ϕ\to K^+ K^-$. Using these events, we have measured the $B^0_s$ lifetime to be $τ(B^0_{s}) = 1.398 \pm 0.044$ $({stat}) ^{+0.028}_{-0.025}$ $({syst}) {ps}$. This is the most precise measurement of the $B_s^0$ lifetime to date.
dc.descriptionTo appear in Phys. Rev. Lett., 7 pages, 2 figures
dc.identifierhttps://arxiv.org/abs/hep-ex/0604046
dc.identifierhttp://arxiv.org/abs/hep-ex/0604046
dc.identifierPhys.Rev.Lett.97:241801,2006
dc.identifierdoi:10.1103/PhysRevLett.97.241801
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/206152
dc.subjectHigh Energy Physics - Experiment
dc.titleMeasurement of the $B^{0}_{s}$ Lifetime Using Semileptonic Decays
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