The V/S test of long-range dependence in random fields

dc.creatorLavancier, Frédéric
dc.date2008-07-30
dc.date2008-12-30
dc.date.accessioned2026-07-07T12:22:26Z
dc.date.available2026-07-07T12:22:26Z
dc.descriptionRecently, Giraitis et al. (2003, [10]) proposed the $V/S$ statistic for testing long memory in random sequences. We generalize this statistic to the setting of random fields. The null hypothesis is concerned with short memory random fields while the alternative contains a very large family of long memory random fields. Contrary to most of the previous works dealing with long-range dependence, no assumption is made about the isotropy of the strong dependence. Some simulations are presented in order to assess the power of the test according to the kind of long memory in presence.
dc.descriptionPublished in at http://dx.doi.org/10.1214/08-EJS280 the Electronic Journal of Statistics (http://www.i-journals.org/ejs/) by the Institute of Mathematical Statistics (http://www.imstat.org)
dc.identifierhttps://arxiv.org/abs/0807.4853
dc.identifierhttp://arxiv.org/abs/0807.4853
dc.identifierElectronic Journal of Statistics 2008, Vol. 2, 1373-1390
dc.identifierdoi:10.1214/08-EJS280
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/213652
dc.subjectStatistics Theory
dc.titleThe V/S test of long-range dependence in random fields
dc.typetext

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