Fractional statistics of topological defects in graphene and related structures

dc.creatorSeradjeh, B.
dc.creatorFranz, M.
dc.date2007-09-26
dc.date.accessioned2026-07-07T10:06:17Z
dc.date.available2026-07-07T10:06:17Z
dc.descriptionWe show that fractional charges bound to topological defects in the recently proposed time-reversal-invariant models on honeycomb and square lattices obey fractional statistics. The effective low-energy description is given in terms of a `doubled' level-2 Chern-Simons field theory, which is parity and time-reversal invariant and implies two species of semions (particles with statistical angle pi/2) labeled by a new emergent quantum number that we identify as the fermion axial charge.
dc.description4 pages, 1 figure, REVTeX4
dc.identifierhttps://arxiv.org/abs/0709.4258
dc.identifierhttp://arxiv.org/abs/0709.4258
dc.identifierPhys. Rev. Lett. 101, 146401 (2008).
dc.identifierdoi:10.1103/PhysRevLett.101.146401
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/170273
dc.subjectStrongly Correlated Electrons
dc.subjectMesoscale and Nanoscale Physics
dc.titleFractional statistics of topological defects in graphene and related structures
dc.typetext

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