Identification and Distance Measures of Measurement Apparatus
| dc.creator | Ji, Zhengfeng | |
| dc.creator | Feng, Yuan | |
| dc.creator | Duan, Runyao | |
| dc.creator | Ying, Mingsheng | |
| dc.date | 2006-01-13 | |
| dc.date | 2006-04-05 | |
| dc.date.accessioned | 2026-07-07T07:00:25Z | |
| dc.date.available | 2026-07-07T07:00:25Z | |
| dc.description | We propose simple schemes that can perfectly identify projective measurement apparatus secretly chosen from a finite set. Entanglements are used in these schemes both to make possible the perfect identification and to improve the efficiency significantly. A brief discussion on the problem of how to appropriately define distance measures of measurements is also provided based on the results of identification. | |
| dc.description | 5 pages, RevTeX, 1 figure. Revised version with more examples and a reorganization of the contents | |
| dc.identifier | https://arxiv.org/abs/quant-ph/0601090 | |
| dc.identifier | http://arxiv.org/abs/quant-ph/0601090 | |
| dc.identifier | Phys. Rev. Lett. 96, 200401 (2006) | |
| dc.identifier | doi:10.1103/PhysRevLett.96.200401 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/108024 | |
| dc.subject | Quantum Physics | |
| dc.title | Identification and Distance Measures of Measurement Apparatus | |
| dc.type | text |