Failure Analysis and Field Failures: a Real Shortcut to Reliability Improvement

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dc.creatorMura, G.
dc.creatorCassanelli, G.
dc.date2007-09-12
dc.date.accessioned2026-07-07T08:29:34Z
dc.date.available2026-07-07T08:29:34Z
dc.descriptionStarting from two case histories, where only after thorough Failure Analysis the suddenly appearance of a failure was linked to much earlier events, the possibility of improving the reliability and of adjusting the reliability prediction tools are discussed.
dc.descriptionSubmitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions)
dc.identifierhttps://arxiv.org/abs/0709.1875
dc.identifierhttp://arxiv.org/abs/0709.1875
dc.identifierDans Proceedings of 12th International Workshop on Thermal investigations of ICs - THERMINIC 2006, Nice : France (2006)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/137980
dc.subjectOther Condensed Matter
dc.titleFailure Analysis and Field Failures: a Real Shortcut to Reliability Improvement
dc.typetext

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