Measurements of RF Cavity Voltages by X-ray Spectrum Measurements

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dc.creatorDuke, J. P.
dc.creatorLetchford, A. P.
dc.creatorFindlay, D. J. S.
dc.date2000-08-09
dc.date2000-08-14
dc.date.accessioned2026-07-07T05:44:24Z
dc.date.available2026-07-07T05:44:24Z
dc.descriptionMeasurement of the endpoints of X-ray spectra emitted from RF cavities is a useful non-invasive technique for measuring peak voltages within the cavities. The matching of calculated X-ray spectra to measured spectra is described, with emphasis upon the endpoint region.
dc.descriptionFor LINAC 2000 Conference, Monterey, 21-25 August 2000 Paper no. MOC08 Second PostScript version to replace first PostScript version in which caption to Fig. 1 overflowed on to second page
dc.identifierhttps://arxiv.org/abs/physics/0008024
dc.identifierhttp://arxiv.org/abs/physics/0008024
dc.identifiereConf C000821 (2000) MOc08
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/83624
dc.subjectAccelerator Physics
dc.titleMeasurements of RF Cavity Voltages by X-ray Spectrum Measurements
dc.typetext

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