Dependence of the gap parameter on the number of CuO2 layers in a unit cell of optimally doped BSCCO, TBCCO, HBCCO and HSCCO

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dc.creatorPonomarev, Ya. G.
dc.creatorTimergaleev, N. Z.
dc.creatorZabezhaylov, A. O.
dc.creatorUk, Kim Ki
dc.creatorLorenz, M. A.
dc.creatorMueller, G.
dc.creatorPiel, H.
dc.creatorSchmidt, H.
dc.creatorJanowitz, C.
dc.creatorKrapf, A.
dc.creatorManzke, R.
dc.date2001-11-19
dc.date.accessioned2026-07-07T02:43:34Z
dc.date.available2026-07-07T02:43:34Z
dc.descriptionWe have measured the superconducting gap Ds in optimally doped samples of BSCCO, TBCCO, HBCCO and HSCCO by Andreev and tunnelling spectroscopy and by ARPES. We have found that the low-temperature value of the gap within experimental errors is linearly increasing with the number n of CuO2 layers in the unit cell of the investigated HTSC-families (n < 4)
dc.identifierhttps://arxiv.org/abs/cond-mat/0111342
dc.identifierhttp://arxiv.org/abs/cond-mat/0111342
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/18551
dc.subjectSuperconductivity
dc.subjectStrongly Correlated Electrons
dc.titleDependence of the gap parameter on the number of CuO2 layers in a unit cell of optimally doped BSCCO, TBCCO, HBCCO and HSCCO
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