AFM's path to atomic resolution
| dc.creator | Giessibl, Franz J. | |
| dc.date | 2005-03-29 | |
| dc.date.accessioned | 2026-07-07T03:04:20Z | |
| dc.date.available | 2026-07-07T03:04:20Z | |
| dc.description | We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tunneling microscopy, the main challenges of AFM and the solutions that have evolved in the first twenty years of its existence are outlined. Some crucial steps along the AFM's path towards higher resolution are discussed, followed by an outlook on current and future applications. | |
| dc.description | Submitted to Materials Today, scheduled for May 2005 issue | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0503671 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0503671 | |
| dc.identifier | Materials Today 8 (5), 32-41(2005) | |
| dc.identifier | doi:10.1016/S1369-7021(05)00844-8 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/26100 | |
| dc.subject | Materials Science | |
| dc.title | AFM's path to atomic resolution | |
| dc.type | text |