Conversion of phase-slip lines into elementary resistive domains in a current-carrying superconducting thin film

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dc.creatorIl'ichev, E. V.
dc.creatorKuznetsov, V. I.
dc.creatorTulin, V. A.
dc.date2003-05-25
dc.date2004-06-23
dc.date.accessioned2026-07-07T02:51:32Z
dc.date.available2026-07-07T02:51:32Z
dc.descriptionA nonmonotonic dependence of the differential resistance of the first step of a phase-slip line on the heat-reservoir temperature near Tc has been observed experimentally for the first time in a superconducting tin film. This behavior is interpreted as a conversion of the phase-slip line into an elementary resistive domain as the result of a deviation from the isothermal conditions.
dc.description3 pages, 3 figures, RevTex4. Present address of the first author added
dc.identifierhttps://arxiv.org/abs/cond-mat/0305584
dc.identifierhttp://arxiv.org/abs/cond-mat/0305584
dc.identifierJETP Letters 56, 295 (1992) [Russian original: Pis'ma v Zh. Eksp. Teor. Fiz. 56, 297 (1992)]
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/21491
dc.subjectSuperconductivity
dc.subjectMesoscale and Nanoscale Physics
dc.titleConversion of phase-slip lines into elementary resistive domains in a current-carrying superconducting thin film
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