High Field Mobility and Diffusivity of Electron Gas in Silicon Devices

dc.creatorLiotta, S. F.
dc.creatorMajorana, A.
dc.date2000-03-28
dc.date.accessioned2026-07-07T02:37:13Z
dc.date.available2026-07-07T02:37:13Z
dc.descriptionIn this paper the Boltzmann equation describing the carrier transport in a semiconductor is considered. A modified Chapman-Enskog method is used, in order to find approximate solutions in the weakly non-homogeneous case. These solutions allow to calculate the mobility and diffusion coefficients as function of the electric field. The integral-differential equations derived by the above method are numerically solved by means of a combination of spherical harmonics functions and finite-difference operators. The Kane model for the electron band structure is assumed; the parabolic band approximation is obtained as a particular case. The numerical values for mobility and diffusivity in a silicon device are compared with the experimental data. The Einstein relation is also shown.
dc.description15 pages, Latex, 5 figures (postscript) included in the text
dc.identifierhttps://arxiv.org/abs/cond-mat/0003457
dc.identifierhttp://arxiv.org/abs/cond-mat/0003457
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/16203
dc.subjectStatistical Mechanics
dc.titleHigh Field Mobility and Diffusivity of Electron Gas in Silicon Devices
dc.typetext

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