Direct and absolute temperature mapping and heat transfer measurements in diode-end-pumped Yb:YAG

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dc.creatorChenais, Sebastien
dc.creatorForget, Sebastien
dc.creatorDruon, Frederic
dc.creatorBalembois, Francois
dc.creatorGeorges, Patrick
dc.date2006-10-10
dc.date.accessioned2026-07-07T07:29:52Z
dc.date.available2026-07-07T07:29:52Z
dc.descriptionWe report direct and absolute temperature measurements in a diode-end-pumped Yb:YAG crystal, using a calibrated infrared camera, with a 60-$μ$m spatial resolution. The heat transfer coefficient has been measured, for the first time to our knowledge, with four different types of thermal contact (H = 0.25, 0.28, 0.9 and 2.0 for bare contact, graphite layer, indium foil and heat sink grease respectively). The dynamics of thermal effects is also presented.
dc.identifierhttps://arxiv.org/abs/physics/0610061
dc.identifierhttp://arxiv.org/abs/physics/0610061
dc.identifierApplied Physics B 79 (2004) 221-224
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/118277
dc.subjectOptics
dc.titleDirect and absolute temperature mapping and heat transfer measurements in diode-end-pumped Yb:YAG
dc.typetext

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