Comment on ``Method to analyze electromechanical stability of dielectric elastomers" [Appl. Phys. Lett. 91, 061921 (2007)]

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dc.creatorNorris, Andrew N.
dc.date2007-09-16
dc.date2007-10-01
dc.date.accessioned2026-07-07T08:53:58Z
dc.date.available2026-07-07T08:53:58Z
dc.descriptionThe model of Zhao and Suo can be readily generalized to predict the critical breakdown electric field $E_c$ value of elastomers with arbitrary elastic strain energy function. An explicit expression for $E_c$ is presented for elastomeric thin films under biaxial strain and comparisons are made with experimental data using a two term Ogden rubber elasticity model. Simplified results for uniaxial and for equi-biaxial stress provide further insight into the findings of Zhao and Suo.
dc.description2 pages
dc.identifierhttps://arxiv.org/abs/0709.2497
dc.identifierhttp://arxiv.org/abs/0709.2497
dc.identifierAppl. Phys. Lett. 92(2), 026101, 2008
dc.identifierdoi:10.1063/1.2833688
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/145768
dc.subjectMaterials Science
dc.titleComment on ``Method to analyze electromechanical stability of dielectric elastomers" [Appl. Phys. Lett. 91, 061921 (2007)]
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