A Scanning Electron Microscope for Ultracold Atoms

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dc.creatorGericke, T.
dc.creatorUtfeld, C.
dc.creatorHommerstad, N.
dc.creatorOtt, H.
dc.date2006-07-14
dc.date.accessioned2026-07-07T07:16:00Z
dc.date.available2026-07-07T07:16:00Z
dc.descriptionWe propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focussed electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atoms position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.
dc.description5 pages, 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0607358
dc.identifierhttp://arxiv.org/abs/cond-mat/0607358
dc.identifierLaser Phys. Lett. 3, 415-419 (2006)
dc.identifierdoi:10.1002/lapl.200610028
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/113430
dc.subjectStatistical Mechanics
dc.titleA Scanning Electron Microscope for Ultracold Atoms
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