Origin of dielectric relaxation observed in complex perovskite oxides Ba(1-x)La(x)Ti(1-x)Cr(x)O3

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dc.creatorFukunaga, Mamoru
dc.creatorUesu, Yoshiaki
dc.date2005-04-04
dc.date.accessioned2026-07-07T03:04:24Z
dc.date.available2026-07-07T03:04:24Z
dc.descriptionFrequency dependence of the dielectric constant of complex perovskite oxide Ba(1-x)La(x)Ti(1-x)Cr(x)O3 (BLTC) ceramics with the composition ratio 0.4<= x <= 0.7 is precisely measured in the temperature range from 20 K to 300 K, and the dielectric relaxation is found to be quite similar to that of CaCu3Ti4O12 (CCTO), which exhibits the Debye-like frequency dispersion around 100 K. In BLTC, the ferroelectric phase transition temperature shifts to lower temperature with increase of x, while a remarkable dielectric relaxation newly appears at higher temperature region. The dielectric relaxation can be explained by an equivalent model of a series of two R-C parallel circuits, which corresponds to a heterogeneous structure in the sample with an internal barrier layer capacitor. Temperature and frequency dependences of the measured dielectric constant are explained well by the model with the temperature-dependent electrical conductivity and temperature-independent intrinsic dielectric constant. It is also found that the contribution of thin layer to the dielectric relaxation in a high temperature region is affected by the dc bias field on the sample.
dc.description24 pages, 9 figures, submitted to J. Appl. Phys
dc.identifierhttps://arxiv.org/abs/cond-mat/0504064
dc.identifierhttp://arxiv.org/abs/cond-mat/0504064
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/26126
dc.subjectMaterials Science
dc.titleOrigin of dielectric relaxation observed in complex perovskite oxides Ba(1-x)La(x)Ti(1-x)Cr(x)O3
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