Critical behavior of magnetic thin films as a function of thickness
| dc.creator | Phu, X. T. Pham | |
| dc.creator | Ngo, V. Thanh | |
| dc.creator | Diep, H. T. | |
| dc.date | 2007-12-19 | |
| dc.date.accessioned | 2026-07-07T08:50:21Z | |
| dc.date.available | 2026-07-07T08:50:21Z | |
| dc.description | We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior remains dominant at small thicknesses, there is a systematic continuous deviation of the critical exponents from their 2D values. We observe that in the same range of varying thickness the deviation of the exponent $ν$ is rather small, while exponent $β$ suffers a larger deviation. We explain these deviations using the concept of "effective" exponents suggested by Capehart and Fisher in a finite-size analysis. The shift of the critical temperature with the film thickness obtained here by MC simulation is in an excellent agreement with their prediction. | |
| dc.description | 10 pages, 19 figures | |
| dc.identifier | https://arxiv.org/abs/0712.3181 | |
| dc.identifier | http://arxiv.org/abs/0712.3181 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/144576 | |
| dc.subject | Materials Science | |
| dc.title | Critical behavior of magnetic thin films as a function of thickness | |
| dc.type | text |