Ferroelectricity in ultra-thin perovskite films

Simple item page
dc.creatorSai, Na
dc.creatorKolpak, Alexie M.
dc.creatorRappe, Andrew M.
dc.date2005-05-03
dc.date.accessioned2026-07-07T03:05:00Z
dc.date.available2026-07-07T03:05:00Z
dc.descriptionWe report studies of ferroelectricity in ultra-thin perovskite films with realistic electrodes. The results reveal stable ferroelectric states in thin films less than 10 Åthick with polarization normal to the surface. Under short-circuit boundary conditions, the screening effect of realistic electrodes and the influence of real metal/oxide interfaces on thin film polarization are investigated. Our studies indicate that metallic screening from the electrodes is affected by the difference in work functions at oxide surfaces. We demonstrate this effect in ferroelectric PbTiO$_3$ and BaTiO$_3$ films.
dc.description4 pages in REVTEX4, 4 epsf figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0505051
dc.identifierhttp://arxiv.org/abs/cond-mat/0505051
dc.identifierPhys. Rev. B 72, 020101(R) (2005)
dc.identifierdoi:10.1103/PhysRevB.72.020101
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/26304
dc.subjectMaterials Science
dc.titleFerroelectricity in ultra-thin perovskite films
dc.typetext

Files

Collections

arXiv