Stochastic dynamics of a Josephson junction threshold detector

dc.creatorSukhorukov, Eugene V.
dc.creatorJordan, Andrew N.
dc.date2006-11-30
dc.date2006-12-19
dc.date.accessioned2026-07-07T07:54:43Z
dc.date.available2026-07-07T07:54:43Z
dc.descriptionWe generalize the stochastic path integral formalism by considering Hamiltonian dynamics in the presence of general Markovian noise. Kramers' solution of the activation rate for escape over a barrier is generalized for non-Gaussian driving noise in both the overdamped and underdamped limit. We apply our general results to a Josephson junction detector measuring the electron counting statistics of a mesoscopic conductor. Activation rate dependence on the third current cumulant includes an additional term originating from the back-action of the measurement circuit.
dc.description5 pages, 2 figures, discussion of experiment added, typos corrected
dc.identifierhttps://arxiv.org/abs/cond-mat/0611783
dc.identifierhttp://arxiv.org/abs/cond-mat/0611783
dc.identifierPhys. Rev. Lett. 98, 136803 (2007)
dc.identifierdoi:10.1103/PhysRevLett.98.136803
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/126717
dc.subjectMesoscale and Nanoscale Physics
dc.subjectStatistical Mechanics
dc.titleStochastic dynamics of a Josephson junction threshold detector
dc.typetext

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