Thickness dependence of critical currents in thin superconductors

dc.creatorGurevich, A.
dc.date2002-07-22
dc.date.accessioned2026-07-07T02:46:24Z
dc.date.available2026-07-07T02:46:24Z
dc.descriptionMechanisms of vortex dynamics and pinning and self-field effects which could account for the thickness dependence of the critical current density J_c of superconducting films are addressed. It is shown that at low magnetic fields B, the 2D single-vortex pinning and thermal fluctuations yield J_c proportional to (1/sqrt{d})exp[-(d_m/d)^{1/2}], if the film thickness d is smaller than the pinning correlation length along B. The model describes the dependence of J_c on d observed on YBa_2Cu_3O_7 coated conductors for d < 2(mu)m. Measurements of J_c(d) in strong magnetic fields are proposed to probe whether the dependence of J_c on d is mostly determined by the 2D pinning or changes in the material microstructure as the film gets thicker.
dc.description3 pages, 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0207526
dc.identifierhttp://arxiv.org/abs/cond-mat/0207526
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/19656
dc.subjectSuperconductivity
dc.titleThickness dependence of critical currents in thin superconductors
dc.typetext

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