Characterizing electron entanglement in multiterminal mesoscopic conductors

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dc.creatorGiovannetti, Vittorio
dc.creatorFrustaglia, Diego
dc.creatorTaddei, Fabio
dc.creatorFazio, Rosario
dc.date2007-02-22
dc.date2008-02-18
dc.date.accessioned2026-07-07T09:21:16Z
dc.date.available2026-07-07T09:21:16Z
dc.descriptionWe show that current correlations at the exit ports of a beam splitter can be used to detect electronic entanglement for a fairly general input state. This includes the situation where electron pairs can enter the beam splitter from the same port or be separated due to backscattering. The proposed scheme allows to discriminate between occupation-number and degree-of-freedom entanglement.
dc.description5 pages, 1 figure. Ref. added
dc.identifierhttps://arxiv.org/abs/cond-mat/0702519
dc.identifierhttp://arxiv.org/abs/cond-mat/0702519
dc.identifierPhys. Rev. B 75, 241305(R) (2007)
dc.identifierdoi:10.1103/PhysRevB.75.241305
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/154965
dc.subjectMesoscale and Nanoscale Physics
dc.subjectQuantum Physics
dc.titleCharacterizing electron entanglement in multiterminal mesoscopic conductors
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