Extreme value statistics and the Pareto distribution in silicon photonics

dc.creatorBorlaug, David
dc.creatorFathpour, Sasan
dc.creatorJalali, Bahram
dc.date2008-09-15
dc.date.accessioned2026-07-07T10:02:53Z
dc.date.available2026-07-07T10:02:53Z
dc.descriptionL-shape probability distributions are extremely non-Gaussian distributions that have been surprisingly successful in describing the frequency of occurrence of extreme events, ranging from stock market crashes and natural disasters, the structure of biological systems, fractals, and optical rogue waves. In this paper, we show that fluctuations in stimulated Raman scattering in silicon, as well as in coherent anti-Stokes Raman scattering, can follow extreme value statistics and provide mathematical insight into the origin of this behavior. As an example of the experimental observations, we find that 16% of the Stokes pulses account for 84% of the pump energy transfer, an uncanny resemblance to the empirical Pareto principle or the 80/20 rule that describes important observation in socioeconomics.
dc.descriptionTo be published in the New Journal of Physics
dc.identifierhttps://arxiv.org/abs/0809.2565
dc.identifierhttp://arxiv.org/abs/0809.2565
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/169132
dc.subjectOptics
dc.titleExtreme value statistics and the Pareto distribution in silicon photonics
dc.typetext

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