Interfacial Energy and Fine Defect Structures for Incoherent Films

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dc.creatorCermelli, Paolo
dc.creatorGurtin, Morton E.
dc.creatorLeoni, Giovanni
dc.date1999-10-22
dc.date1999-10-26
dc.date.accessioned2026-07-07T03:14:52Z
dc.date.available2026-07-07T03:14:52Z
dc.descriptionThis note summarizes recent results in which modern techniques of the calculus of variations are used to obtain qualitative features of film-substrate interfaces for a broad class of interfacial energies. In particular, we show that the existence of a critical thickness for incoherency and the formation of interfacial dislocations depend strongly on the convexity and smoothness of the interfacial energy function.
dc.description4 pages
dc.identifierhttps://arxiv.org/abs/cond-mat/9910360
dc.identifierhttp://arxiv.org/abs/cond-mat/9910360
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/29838
dc.subjectCondensed Matter
dc.titleInterfacial Energy and Fine Defect Structures for Incoherent Films
dc.typetext

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