Enhanced anomalous scattering by superconducting nanofilms vs T at O:K, Cu:L2,3, Ba:M4,5

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dc.creatorAcrivos, J. V.
dc.date2005-09-20
dc.date.accessioned2026-07-07T06:18:18Z
dc.date.available2026-07-07T06:18:18Z
dc.descriptionEnhanced (001) anomalous scattering by YBa2Cu3O7-d 50 nm films on SrTiO3 substrates with and without a grain boundary versus temperature is interpreted using crystallographic weights to distinguish it from total electron yield and fluorescence spectra. The power of diffraction enhancement is to ascertain the film oxygen composition from the changes in the c-axis, c0 as the film surface is scanned across the grain boundary, and to determine that c0 is constant versus temperature across the superconducting phase transition.
dc.description4 pages, 6 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0509523
dc.identifierhttp://arxiv.org/abs/cond-mat/0509523
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/94690
dc.subjectSuperconductivity
dc.subjectMaterials Science
dc.titleEnhanced anomalous scattering by superconducting nanofilms vs T at O:K, Cu:L2,3, Ba:M4,5
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