X-ray and $γ$-ray propagation in bent crystals with flat and cylindrical surfaces
| dc.creator | Apolloni, A. | |
| dc.creator | Mana, G. | |
| dc.creator | Palmisano, C. | |
| dc.creator | Zosi, G. | |
| dc.date | 2008-02-25 | |
| dc.date.accessioned | 2026-07-07T10:03:07Z | |
| dc.date.available | 2026-07-07T10:03:07Z | |
| dc.description | In this paper we investigate x-ray and $γ$-ray propagation in crystals having a constant strain gradient and flat or cylindrical surfaces. When a displacement field is present, we solve the Takagi-Taupin equations either by the Riemann-Green method or by a numerical method. We apply the results to study the operation of a double-crystal Laue-Laue diffractometer having a flat collimating crystal followed by a bent analyzer crystal. In particular, we examine the effect of the analyzer strain on the location of the diffraction peaks in the dispersive and non-dispersive setup, thus confirming our previously reported peak-location as being set only by the diffracting plane spacing on the analyzer entrance surface. | |
| dc.description | 25 pages, 7 figures, 1 table | |
| dc.identifier | https://arxiv.org/abs/0802.3722 | |
| dc.identifier | http://arxiv.org/abs/0802.3722 | |
| dc.identifier | Acta Cryst. (2008). A64, 549-559 | |
| dc.identifier | doi:10.1107/S0108767308021508 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/169168 | |
| dc.subject | Instrumentation and Detectors | |
| dc.subject | Optics | |
| dc.title | X-ray and $γ$-ray propagation in bent crystals with flat and cylindrical surfaces | |
| dc.type | text |